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Wei, H., Johnston, E., & Binnie, D. (1998). Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), (2565). ISSN 0091-3286
This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained ...
Walczyk, R., Armitage, A., & Binnie, D. (2010). Comparative study on connected component labeling algorithms for embedded video processing systems. In H. Deligiannidis (Ed.), Proceedings of the IPCV'10
The objective of this paper is to carry out a detailed analysis of the most popular connected components labeling (CCL) algorithms for binary images. This study investigates t...