Article
19 March 2022
Published
MDPI AG
10.3390/electronics11060955
Edinburgh Napier Funded
Khan, M. A., Ahmed, F., Khan, M. D., Ahmad, J., Kumar, H., & Pitropakis, N. (2022). A Smart and Robust Automatic Inspection of Printed Labels Using an Image Hashing Technique. Electronics, 11(6), Article 955. https://doi.org/10.3390/electronics11060955
LecturerSchool of Computing Engineering and the Built Environment
0131 455 3237
J.Ahmad@napier.ac.uk
Associate ProfessorSchool of Computing Engineering and the Built Environment
0131 455 2789
N.Pitropakis@napier.ac.uk
image hashing; fault detection; speeded up robust features (SURF); robustness and detection; maximum likelihood estimation sample consensus (MLESAC); feature matching; region of interest (ROI) extraction; ROI matching; feature extraction time; hash matching
29MB