Wei, H., Johnston, E., & Binnie, D. (1998). Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), (2565). ISSN 0091-3286
This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained ...
Engineering and Physical Sciences Research Council
Industrial Case studentship - The aim of the project is to develop algorithms and an Application Program Interface (API) that will provide an intelligent analysis of the complex signals generated by a...