Citation
Hu, J., Snell, A. J., Hajto, J., Rose, M. J., & Edmiston, W. (2001). Field-induced anomalous changes in Cr/a-SI:H/V thin film structures. Thin Solid Films, 396, 240-249. https://doi.org/10.1016/S0040-6090%2801%2901188-9
Authors
Keywords
Transition elements ; Experimental study ; Silicon ; Chromium ; Vanadium ; Thin films ; Amorphous hydrogenated material ; Solid-solid interfaces ; Quantization ; Semiconductor metal transition ; Electric field effects ; IV characteristic ; Anomaly ; Electrical conductivity
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