Research Output

Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

  This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained by deriving the modulation transfer function (MTF) from the measured contrast transfer function (CTF). Basic signal- processing techniques are used to establish a relationship between the MTF and the CTF. Experimental methodology is discussed with respect to avoidance of shift variation in the CTF. Discrete Fourier transformation is applied for a power-spectrum analysis of the MTF. Using the CTF as a measure of performance, a series of experiments were carried out to characterize an imaging system based on an integrated CMOS camera. The experimental results showed that this approach can be applied in general, for the assessment of spatial resolution for digital imaging systems.

  • Type:

    Article

  • Date:

    01 September 1998

  • Publication Status:

    Published

  • Publisher

    SPIE-Intl Soc Optical Eng

  • DOI:

    10.1117/1.601778

  • ISSN:

    0091-3286

  • Dewey Decimal Classification:

    620.5 Nanotechnology & nanoparticles

  • Funders:

    Edinburgh Napier Funded

Citation

Wei, H., Johnston, E., & Binnie, D. (1998). Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), 2565. https://doi.org/10.1117/1.601778

Authors

Keywords

Engineering(all); Atomic and Molecular Physics, and Optics

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