Article
01 September 1998
Published
SPIE-Intl Soc Optical Eng
10.1117/1.601778
0091-3286
620.5 Nanotechnology & nanoparticles
Edinburgh Napier Funded
Wei, H., Johnston, E., & Binnie, D. (1998). Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), 2565. https://doi.org/10.1117/1.601778
ReaderSchool of Engineering and The Built Environment
0131 455 2343
D.Binnie@napier.ac.uk
Engineering(all); Atomic and Molecular Physics, and Optics