Article
19 May 2017
Published
Institute of Electrical and Electronics Engineers (IEEE)
10.1109/access.2017.2705644
Historic Funder (pre-Worktribe)
Jan, S. U., Lee, Y., Shin, J., & Koo, I. (2017). Sensor Fault Classification Based on Support Vector Machine and Statistical Time-Domain Features. IEEE Access, 5, 8682-8690. https://doi.org/10.1109/access.2017.2705644
LecturerSchool of Computing Engineering and the Built Environment
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S.Jan@napier.ac.uk