Article
01 December 2018
Published
10.3970/cmc.2018.01830
1546-2218
QA75 Electronic computers. Computer science
005.8 Data security
European Commission
Xiao, B., Wang, Z., Liu, Q., & Liu, X. (2018). SMK-means: An Improved Mini Batch K-means Algorithm Based on Mapreduce with Big Data. Computers, Materials & Continua, 56(3), 365-379. https://doi.org/10.3970/cmc.2018.01830
Senior Research FellowSchool of Computing
0131 455 3460
Q.Liu@napier.ac.uk
ProfessorSchool of Computing Engineering and the Built Environment
0131 455 2747
X.Liu@napier.ac.uk
Big data, outlier detection, SMK-means, Mini Batch K-means, simulated annealing.
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